Memory System and Data Reading Method Thereof

ABSTRACT

A memory system includes a memory and a memory controller operating to control the memory. The memory includes a random accessible memory including a memory cell array operable in a random access mode, a NAND flash memory, and a selection circuit making the memory controller operate either one of the random accessible memory or the NAND flash memory.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a Divisional application of U.S. patent applicationSer. No. 11/764,613, filed Jun. 18, 2007, which claims priority under 35U.S.C. §119 to Korean Patent Application No. 10-2007-0014966 filed onFeb. 13, 2007, the entire contents of which are hereby incorporated byreference.

BACKGROUND

1. Technical Field

The present invention relates to a memory systems. More particularly, toa NAND flash memory system and a data reading method thereof.

2. Discussion of the Related Art

In many computing systems, software modules or programs are executed ‘inplace’. This technology is generally known as XIP (eXecute-in-place), bywhich program are directly executed in flash memory for reasons of smallmain memory size and short boot time in mobile memory systems. XIPapplications can be accomplished in flash memory without transferringexecution codes to RAM from the flash memory. XIP technology enablesreduction of memory requirements from RAMs and multi-executions of manyapplication programs. As NAND flash memory is usually inoperable inXIP-enabled environments, NOR flash memory is normally used for XIPapplications.

Many studies are being conducted to provide XIP applications to NANDflash memory. Making NAND flash memory equipped with XIP functionsallows them to operate in random accessible modes.

SUMMARY OF THE INVENTION

Exemplary embodiments of the present invention provide a NAND flashmemory system capable of executing a random access function and a datareading method thereof.

According to an exemplary embodiment of the present invention, a memorysystem includes a memory and a memory controller operating to controlthe memory. The memory includes random accessible memory including amemory cell array enabling a random access, a NAND flash memory, and aselection circuit to select between the random accessible memory and theNAND flash memory.

In an exemplary embodiment, the memory is integrated in one chip.

In an exemplary embodiment, the random accessible memory programs datain single-page units and reads data in the random access mode.

In an exemplary embodiment, the memory cell array of the randomaccessible memory partially uses a NAND flash memory cell array.

In an exemplary embodiment, the random accessible memory has a memorycell array that is structured as a string including at least one wordline.

In an exemplary embodiment, the random accessible memory has a memorycell array that is configured in a first string structure including aword line.

In an exemplary embodiment, the random accessible memory uses a pagebuffer circuit of the NAND flash memory while programming data.

In an exemplary embodiment, the random accessible memory furtherincludes a sense amplifier circuit for random access and read data.

In an exemplary embodiment, the NAND flash memory includes a memory cellarray with 32 word lines in a second string structure.

In an exemplary embodiment, the first string of the random accessiblememory is connected to a first bit line and the second string of theNAND flash memory is connected to a second bit line. The selectioncircuit connects the first bit line with the second bit line.

In an exemplary embodiment, the selection circuit connects the first bitline with the second bit line while programming data into the randomaccessible memory.

In an exemplary embodiment, the selection circuit conducts the randomaccess mode with disconnecting the first bit line from the second bitline while reading data from the random accessible memory.

In an exemplary embodiment, the selection circuit uses a high-voltagetransistor for connecting the first bit line to the second bit line.

In an exemplary embodiment, the random accessible memory and the NANDflash memory share a data line.

In an exemplary embodiment, the selection circuit includes a data lineselection circuit to connect a data line with the random accessiblememory or the NAND flash memory.

According to an exemplary embodiment of the present invention, a memorysystem includes a memory and a memory controller operating to controlthe memory. The memory includes a random accessible memory including amemory cell array enabling random access, and a NAND flash memory. Therandom accessible memory uses the NAND flash memory to program data inpages.

In an exemplary embodiment, the random accessible memory has a memorycell array that is configured in a first string structure including aword line.

In an exemplary embodiment, the NAND flash memory includes a memory cellarray with 32 word lines in a second string structure.

In an exemplary embodiment, the first string of the random accessiblememory and the second string of the NAND flash memory are connected tothe same bit line.

In an exemplary embodiment, the random accessible memory and the NANDflash memory share a Y-decoder for activating the bit line.

In an exemplary embodiment, the random accessible memory is associatedwith a sense amplifier circuit placed under the Y-decoder in structure.

In an exemplary embodiment, the memory system is an embedded memorysystem.

In an exemplary embodiment, the memory is integrated in one chip.

In an exemplary embodiment, the memory system is a smart card.

Exemplary embodiments of the present invention also provide a NAND flashmemory including a first memory cell array with a first string structureenabling a random access mode, a second memory cell array with a secondstring structure enabling random access, and a block selection circuitoperating to select a memory field from the first and second memory cellarrays.

In an exemplary embodiment, the block selection circuit selects thefirst memory cell array as the memory field when stored data are to beread in random access.

In an exemplary embodiment, the first string structure includes one wordline.

In an exemplary embodiment, the first string is connected to a first bitline and the second string is connected to a second bit line. The blockselection circuit connects the first bit line with the second bit line.

In an exemplary embodiment, the NAND flash memory further includes asense amplifier circuit detecting data of the first bit line, forexample, random access data stored in the first memory cell array.

In an exemplary embodiment, the first memory cell array is programmedwith data in pages.

In an exemplary embodiment, the first memory cell array shares a pagebuffer circuit with the second memory cell array and programs data inpages.

In an exemplary embodiment, the block selection circuit connects thefirst bit line to the second bit line while programming data into thememory cell array.

In an exemplary embodiment, the first and second memory cell arraysshare a data line.

In an exemplary embodiment, the block selection circuit includes a dataline selection circuit connecting a data line with the first memory cellarray or the second memory cell array.

Exemplary embodiments of the present invention further provide a methodfor reading data in a random accessible NAND flash memory system. Thismethod includes programming data in single-page units, checking whetherdata to be read are code data, and reading the data in a random accesswhen the data to be read are code data.

In an exemplary embodiment, the code data executes an XIP function.

A further understanding of the nature of the present invention hereinmay be realized by reference to the remaining portions of thespecification and the attached drawings.

BRIEF DESCRIPTION OF THE FIGURES

Non-limiting and non-exhaustive exemplary embodiments of the presentinvention will be described with reference to the following figures,wherein like reference numerals may refer to like parts throughout thevarious figures. In the figures:

FIG. 1 shows a memory system according to an exemplary embodiment of thepresent invention;

FIG. 2 illustrates the memory shown in FIG. 1 according to an exemplaryembodiment of the present invention;

FIG. 3 illustrates the memory shown in FIG. 1 according to an exemplaryembodiment of the present invention;

FIG. 4 shows a memory system according to an exemplary embodiment of thepresent invention;

FIG. 5 illustrates the memory shown in FIG. 4 according to an exemplaryembodiment of the present invention; and

FIG. 6 shows a procedure of reading data in the memory system accordingto an exemplary embodiment of the present invention.

DETAILED DESCRIPTION OF THE EXEMPLARY EMBODIMENTS

Exemplary embodiments of the present invention will be described belowin more detail with reference to the accompanying drawings. The presentinvention may, however, be embodied in different forms and should not beconstructed as limited to the exemplary embodiments set forth herein.Like reference numerals may refer to like elements throughout theaccompanying figures.

FIG. 1 shows a memory system 10 according to an exemplary embodiment ofthe present invention. With reference to FIG. 1, the memory system 10includes a memory controller 100 and a memory 200. A central processingunit (CPU) 120 of the memory controller 100 operates to generallycontrol the memory 200. The memory 200 includes a random accessiblememory 220, a NAND flash memory 240, and a selection circuit 260. TheCPU 120 independently controls the random accessible memory 220 and theNAND flash memory 240 of the memory 200. The selection circuit 260connects the memory controller to the random accessible memory 220 or tothe NAND flash memory 240 in compliance with a command of the CPU 120.

In the memory 200, the random accessible memory 220 and the NAND flashmemory 240 are integrated in one chip. The random accessible memory 220includes a memory cell array that is operable in a random access mode.Here, the memory cell array includes nonvolatile memory cells. Forexample, the random accessible memory 220 may be implemented with aparallel flash memory. This parallel flash memory is constructed inparallel arrangement with memory cells between a bit line and a groundline. The parallel flash memory is able to read or write data from orinto an address regardless of the arrangement of the memory cells. Thememory cells are accessible in single-byte units. There are severalkinds of parallel flash memory, for example, electrically erasable andprogrammable read-only memory (EEPROMs), NOR flash memory, dividedbit-line NOR (DINOR) flash memory, and so on. The random accessiblememory 220 may be used with a partial memory cell array of a NAND flashmemory. This will be detailed below in conjunction with FIGS. 2, 3, and5.

The memory system 10, according to an exemplary embodiment of thepresent invention, is associated with the selection circuit 260, whichis included in the memory 200. The selection circuit 206 respectivelycontrols the random accessible memory 220 and the NAND flash memory 240.This memory system 10 is able to assist an XIP function. Accordingly, aprogram is executed directly (for example, in place) in the flashmemory. The XIP function may reduce an amount of RAM required to executethe application program and many application programs may be executed ata time. The memory system 10 equipped with an XIP function may beemployed in a mobile system.

FIGS. 2, 3, and 5 illustrate exemplary embodiments that partially employa memory cell array of a NAND flash memory for the random accessiblememory. For convenience of description, FIGS. 2, 3 and 5 show that asingle word line of the NAND flash memory cell array is used for astructure of the random accessible memory. While these exemplaryembodiments show the single word line for a structure of the randomaccessible memory, the present invention need not be so restricted. Forexample, two or more word lines may be used for the random accessiblememory.

FIG. 2 illustrates an exemplary embodiment of the memory 200 shown inFIG. 1. Referring to FIG. 2, the memory 200 includes the randomaccessible memory 220 and the NAND flash memory 240.

The random accessible memory 220 programs data by the page and readsdata in a random access mode. The random accessible memory 220 includesa 1-wordline string memory cell array 222, an X-decoder 224, a Y-decoder226, and a sense amplifier circuit 228.

The 1-wordline string memory cell array 222 includes pluralities of bitlines BL0-BLn, each of which having a first selection transistor ST, acell transistor MC, and a second selection transistor GT that areconnected in series. The first selection transistor ST corresponds to astring selection transistor SST of a normal NAND flash memory cellarray, while the second selection transistor GT corresponds to a groundselection transistor GST of a normal NAND flash memory cell array. Thecell transistor MC is formed of a single bit line. The cell transistorMC is supplied with selection signals and word line voltages through twoselection signal lines SSL0 and GSL0 and a word line WL.

The X-decoder 224 receives an row address from an address buffer (notshown), and provides selection signals and a word line voltage to the1-wordline string memory cell array 222 through the selection lines SSL0and GSL0 and the word line WL.

The Y-decoder 226 receives a column address from the address buffer andactivates a corresponding bit line BL.

The sense amplifier circuit 228 detects data of a memory cell connectedto an active bit line of the 1-wordline string memory cell array 222.

The NAND flash memory 240 is comprised of a 32-wordline string memorycell array 242, an X-decoder 244, a Y-decoder 246, and a page buffercircuit 248.

The 32-wordline string memory cell array 242 is connected to the1-wordline string memory cell array 222 of the random accessible memory220 by way of the selection circuit 260. As illustrated in FIG. 2, a1-wordline string 223 is connected to a 32-wordline string 243 by way ofa block selection transistor BST0.

The X-decoder 244 selects a word line in response to a row address inputfrom an address buffer (not shown) and supplies a word line voltage tothe selected word line.

The Y-decoder 246 receives a column address from the address buffer andactivates a bit line corresponding thereto.

The page buffer circuit 248 is connected to the 32-wordline stringmemory cell array 242 through bit lines BL0-BLn. The page buffer circuit248 stores data loaded from a buffer memory (not shown). Datacorresponding to the capacity of one page are loaded into the pagebuffer circuit 248. The loaded data are programmed in one selected pageat a time. In addition, the page buffer circuit 248 reads data from aselected page and temporarily stores the read data therein. Data storedin the page buffer circuit 248 are transferred to the buffer memory inresponse to a read-enabling signal (not shown).

In the meantime, the page buffer circuit 248 is shared by the 1-wordlineand 32-wordline string memory cell arrays 222 and 242 through the bitlines BL0-BLn. The 1-wordline string memory cell array 222 is programmedwith data by the page buffer circuit 248 one page at a time.

The selection circuit 260 selects whether to utilize the memory 200 asthe random accessible memory 220 for conducting the XIP function or theNAND flash memory 240 for storing normal data. Referring to FIG. 2, theselection circuit 260 includes pluralities of block selectiontransistors BST0-BSTn. The plural block selection transistors BST0-BSTnare turned on or off in response to a block selection signal BSStransferred through a block selection line BSL. The block selectiontransistors BST0-BSTn connect or disconnect the 1-wordline string memorycell array 222 to the 32-wordline string memory cell array 242 inresponse to the block selection signal BSS. The block selection signalBSS is provided from the CPU 120 of the memory controller 100.

For example, the block selection transistors BST0-BSTn are turned onwhile programming data into the 1-wordline string memory cell array 222.The 1-wordline string memory cell array 222 is programmed by the pagebuffer circuit 248. The block selection transistors BST0-BSTn are turnedoff while reading data from the 1-wordline string memory cell array 222.The sense amplifier circuit 228 reads data from the 1-wordline stringmemory cell array 222. Thus, the random accessible memory 220 is able torandom access the 1-wordline string memory cell array 222.

The plural block selection transistors BST0-BSTn are associated withhigh-voltage transistors. These high-voltage transistors help inpreventing the 1-wordline string memory cell array 222 from beinginadvertently erased while erasing the 32-wordline string memory cellarray 242.

The block selection signal BSS is provided from the CPU 120, accordingto the present exemplary embodiment, but the present invention is not solimited. The selection circuit 260 may further include a block selectionsignal generator (not shown) for supplying the block selection signalBSS. The block selection signal generator analyses address and datatransferred to the memory controller 100 and generates the blockselection signal BSS after determining which memory is related tocorresponding address and data. For example, if there is a requirementfor programming code data from the memory controller 100 in order tooperate the NAND flash memory 240, the block selection signal generatoroutputs the block selection signal BSS of logical high level andprograms the code data corresponding to the 1-wordline string memorycell array 222.

While the NAND flash memory 240, according to the present exemplaryembodiment, is comprised of the 32-wordline string 243, the presentinvention is not so limited.

In the memory 200, according to exemplary embodiments of the presentinvention, data to be random accessed are stored in the 1-wordlinestring memory cell array 222 of the random accessible memory 220 andnormal data are stored in the 32-wordline string memory cell array 242of the NAND flash memory 240. The random accessible memory 220 and theNAND flash memory 240 are independently controllable by the selectioncircuit 260. In addition, the memory 200, according to exemplaryembodiments of the present invention, is able to read data from therandom accessible memory 220 while programming data into the NAND flashmemory 240.

In the memory 200, according to exemplary embodiments of the presentinvention, the random accessible memory 220 uses the page buffer circuit248 of the NAND flash memory 240 in programming data thereto.

While FIG. 2 shows the random accessible memory 220 and the NAND flashmemory 240 sharing a common data line DL according to an exemplaryembodiment, the present invention is not so limited. FIG. 3 illustratesa memory 300 shown in FIG. 1 according to another exemplary embodimentof the present invention. Referring to FIG. 3, a random accessiblememory 320 and a NAND flash memory 340 are alternatively connected to adata line DL.

The random accessible memory 320 and the NAND flash memory 340 aresimilar to the corresponding elements 220 and 240 shown in FIG. 2.

A selection circuit 360 includes a block selection circuit 362 and adata line selection circuit 364. The block selection circuit 362operates to electrically connect or disconnect the 1-wordline stringmemory cell array 322 and the 32-wordline string memory cell array 342in response to a block selection signal BSS. The data line selectioncircuit 364 operates to connect the data line DL with the randomaccessible memory 320 or the NAND flash memory 340 in response to a dataline selection signal DSS. The data line selection signal DSS isprovided from the memory controller 100.

The memory system 10 of FIG. 1 includes the selection circuit 260 in thememory 200, but the present invention is not limited to this exemplaryembodiment. FIG. 4 shows a memory system 20 according to an exemplaryembodiment of the present invention. A memory 400 of the memory system20 may lack a selection circuit 260 as shown in FIG. 1. The memory 400includes a random accessible memory 420 and a NAND flash memory 440. Therandom accessible memory 420 utilizes several circuit units of the NANDflash memory 440 while writing or reading data therein or therefrom. Thememory system 20 may further include a memory controller 100 having aCPU 120, as explained above with respect to FIG. 1.

FIG. 5 illustrates an embodiment of the memory 400 shown in FIG. 4.Referring to FIG. 5, the memory 400 includes the random accessiblememory 420 and the NAND flash memory 440.

The random accessible memory 420 is comprised of a 1-wordline stringmemory cell array 422, an X-decoder 424, and a random access senseamplifier circuit 428. The random accessible memory 420 shares aY-decoder 446 together with the NAND flash memory 440. The random accesssense amplifier 428 may be located under the Y-decoder 446.

FIG. 6 shows a procedure of reading data in the memory system accordingto an exemplary embodiment of the present invention. Referring to FIG.6, the memory system programs data therein in single-page units. Thememory system reads data in a random access mode according to a kind ofdata, or in single-page units. Methods of programming and reading datain conjunction with FIGS. 1 and 6 are described below for convenience ofexplanation.

First, in a step S110, data are programmed into the memory 200. Duringthis step, all data are programmed in single-page units. The randomaccessible memory 220 and the NAND flash memory 240 are programmed insingle-page units. For example, code data are programmed into the randomaccessible memory 220 in the unit of page. The code data are provided tocontrol the NAND flash memory 240.

Next, in a step S120, before reading the data, it is determined whetherdata to be read stored in the memory 200 are code data. If the data tobe read stored in the memory 200 are code data, the memory controller100 generates and transfers a signal for making the selection circuit260 select the random accessible memory 220.

In a step S130, the selection circuit 260 operates to select the randomaccessible memory 220 in response to the signal transferred from thememory controller 100. The memory controller 100 reads the code datafrom the random accessible memory 220 in the random access mode.

In a step S140, if the data to be read are not code data and are insteadnormal data, the memory controller 100 reads data from the NAND flashmemory 240 in single-page units.

Memory systems according to exemplary embodiments of the presentinvention may be applicable to embedded memory systems.

As stated above, the memory system and data reading method according toexemplary embodiments of the present invention are able to accomplishthe XIP applications even with the NAND flash memory by programming datain single-page units and including the random accessible memory capableof reading data in a random access mode.

While exemplary embodiments of the present invention have been describedin detail, it should be understood that various changes, substitutionsand alterations may be made herein without departing from the scope ofthe invention.

1. A memory system comprising: a memory; and a memory controlleroperating to control the memory, wherein the memory comprises: a randomaccessible memory including a memory cell array enabling random access;a NAND flash memory; and a selection circuit selecting either the randomaccessible memory or the NAND flash memory to be controlled by thememory controller.
 2. The memory system as set forth in claim 1, whereinthe memory is integrated in one chip.
 3. The memory system as set forthin claim 1, wherein the random accessible memory programs data insingle-page units and reads data by random access.
 4. The memory systemas set forth in claim 1, wherein the memory cell array of the randomaccessible memory uses a NAND flash memory cell array.
 5. The memorysystem as set forth in claim 4, wherein the memory cell array of therandom accessible memory is structured as a string including a wordline.
 6. The memory system as set forth in claim 4, wherein the memorycell array of the random accessible memory is configured as a firststring structure including a word line.
 7. The memory system as setforth in claim 6, wherein the random accessible memory uses a pagebuffer circuit of the NAND flash memory while programming data.
 8. Thememory system as set forth in claim 7, wherein the random accessiblememory further includes a sense amplifier circuit for random access andreading of data.
 9. The memory system as set forth in claim 8, whereinthe NAND flash memory includes a memory cell array with 32 word lines ina second string structure.
 10. The memory system as set forth in claim9, wherein the first string of the random accessible memory is connectedto a first bit line and the second string of the NAND flash memory isconnected to a second bit line, wherein the selection circuit connectsthe first bit line with the second bit line.
 11. The memory system asset forth in claim 10, wherein the selection circuit connects the firstbit line with the second bit line while programming data into the randomaccessible memory.
 12. The memory system as set forth in claim 10,wherein the selection circuit disconnects the first bit line from thesecond bit line while reading data from the random accessible memory.13. The memory system as set forth in claim 10, wherein the selectioncircuit uses a high-voltage transistor for connecting the first bit lineto the second bit line.
 14. The memory system as set forth in claim 4,wherein the random accessible memory and the NAND flash memory share adata line.
 15. The memory system as set forth in claim 4, wherein theselection circuit includes a data line selection circuit to connect adata line with either the random accessible memory or the NAND flashmemory.
 16. The memory system as set forth in claim 1, wherein thememory system is an embedded memory system.
 17. The memory system as setforth in claim 1, wherein the memory is integrated in one chip.
 18. Thememory system as set forth in claim 1, wherein the memory system is asmart card.